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Tag: metrology

Semiconductors & Hardware

Enhancing BCD Device Reliability Through Simultaneous Thickness and Reflectivity Metrology

Sholih Cholid Hamdy, September 11, 2026

Maintaining material consistency in the production of bipolar-CMOS-DMOS (BCD) devices has become a central challenge…

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Semiconductors & Hardware

Using Graph Attention for Virtual Metrology in Semiconductor Manufacturing (Intel Foundry, ASU)

Sholih Cholid Hamdy, June 3, 2026

The Critical Shift to Virtual Metrology in Advanced Nodes In modern semiconductor manufacturing, the precision…

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Semiconductors & Hardware

Semiconductor Engineering Library Expands with New Technical Papers Focused on Neural Computing EUV Metrology and GPU Reliability

Sholih Cholid Hamdy, April 21, 2026

The global semiconductor research community has reached a critical juncture where the limitations of traditional…

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Semiconductors & Hardware

The Smart Advantage: How Artificial Intelligence Is Transforming Inspection And Metrology In Semiconductor Manufacturing

Sholih Cholid Hamdy, April 14, 2026

The global semiconductor industry is currently navigating a period of unprecedented transformation, characterized by an…

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